Cryo-FIB specimen preparation for use in a cartridge-type cryo-TEM
نویسندگان
چکیده
منابع مشابه
A novel cryo-FIB lift-out procedure for cryo-TEM sample preparation
The focused-ion-beam (FIB) is the method of choice for site-specific sample preparation for Transmission Electron Microscopy (TEM) in material sciences. A lamella can be physically lifted out from a specific region of a bulk specimen with submicrometer precision and thinned to electron transparency for high-resolution imaging in the TEM. The possibility to use this tool in life sciences applica...
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ژورنال
عنوان ژورنال: Journal of Structural Biology
سال: 2017
ISSN: 1047-8477
DOI: 10.1016/j.jsb.2017.05.011